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2026-03-06
[News] Tiny “Mouse Bites” in Transistors Mapped by Cornell, ASM & TSMC Using Electron Microscopy
As chip manufacturing approaches the sub-2nm era, spotting atomic flaws in next-generation silicon grows ever more challenging. Now, Cornell researchers, partnering with foundry giant TSMC and chipmaking tool player ASM, have for the first time directly visualized atomic-scale defects using high-res...
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